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Wiley - IEEE Ser.: Halbleitermaterial- und Gerätecharakterisierung (US 3/E)-
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eBay-Artikelnr.:334094745649
Artikelmerkmale
- Artikelzustand
- ISBN
- 9780471739067
- EAN
- 9780471739067
- Subject Area
- Technology & Engineering
- Publication Name
- Semiconductor Material and Device Characterization
- Publisher
- Wiley & Sons, Incorporated, John
- Item Length
- 9.4 in
- Subject
- Electronics / Semiconductors
- Publication Year
- 2015
- Series
- IEEE Press Ser.
- Type
- Textbook
- Format
- Hardcover
- Language
- English
- Item Height
- 2 in
- Features
- Revised
- Item Weight
- 44.1 Oz
- Item Width
- 6.4 in
- Number of Pages
- 800 Pages
Über dieses Produkt
Product Identifiers
Publisher
Wiley & Sons, Incorporated, John
ISBN-10
0471739065
ISBN-13
9780471739067
eBay Product ID (ePID)
46953078
Product Key Features
Number of Pages
800 Pages
Language
English
Publication Name
Semiconductor Material and Device Characterization
Publication Year
2015
Subject
Electronics / Semiconductors
Features
Revised
Type
Textbook
Subject Area
Technology & Engineering
Series
IEEE Press Ser.
Format
Hardcover
Dimensions
Item Height
2 in
Item Weight
44.1 Oz
Item Length
9.4 in
Item Width
6.4 in
Additional Product Features
Edition Number
3
Intended Audience
Scholarly & Professional
LCCN
2005-048514
Reviews
"The book is well-illustrated and provides an ample bibliography." ( Optics & Photonics News , 4 November 2015) "I strongly recommend this book for those who want to learn device characterization." ( IEEE Circuits & Devices Magazine , November/December 2006), "I strongly recommend this book for those who want to learn device characterization." ( IEEE Circuits & Devices Magazine , November/December 2006)
Dewey Edition
22
Illustrated
Yes
Dewey Decimal
621.38152
Edition Description
Revised edition
Synopsis
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers., This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials., This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition , including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
LC Classification Number
TK7871.85
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